ThinFilms2

1) Calculates Reflectance and Transmittance through a film stack vs angle of incidence vs wavelength or vs layer thickness for TE and TM polarizations. 2) Material database included. No need to input index of refraction. 3) Repeating Unit-Cell used for ease of data entry. Note: Free version: 1) limited to 1 layer and 1 unit-cell.